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AI at the Edge: Visual Inspection Demo at Embedded World

Defect detection demonstration powered by Critical Link's latest family of Texas Instruments-based system on modules

Visit Critical Link booth #3065 at Embedded World North America this November and see a live defect detection demonstration powered by our latest family of Texas Instruments-based system on modules.

The MitySOM-AM62x/A/P family of modules is based on Texas Instruments Sitara AM62xx, AM62Ax, and AM62Px processors. Each SOM packs a powerful combination of quad core ARM Cortex A53s, Cortex M4F or R5F co-processors, hardware accelerators, a host of memory options, on board power supply, and a range of interfaces. Combined with Texas Instruments Edge AI Studio, which gives access to readily available AI models, developers now have a head start in hardware and AI application development.

Critical Link MitySOM solutions are designed for industrial applications, meaning customers can count on quality and performance, long term availability, and design maintenance. Our engineering and production teams are based in the US, and we provide a level of support that is unmatched in the industry. Learn more about what sets Critical Link apart: https://www.criticallink.com/the-critical-difference/.

Embedded World North America is November 4th to 6th in Anaheim, CA. Register today using Critical Link’s promo code CRITIC25, and be sure to visit us at booth #3065. While there, scan your badge for a chance to win a MitySOM Development Kit of your choice.

Not going to Embedded World? Visit www.criticallink.com to explore our available products and engineering services, or reach out to us directly anytime at info@criticallink.com to discuss how we can support your next project.